Products
SCPA035
Short Description:
SCPA035 Series
ProductParameters
Materials & Plated:
Needle Tube (Barrel): Ph / SP, Au on Ni Plated
Needle 1 (Plunger): SK4/Becu, Au on Ni Plated; PD, No PlatedNeedle 2 (Plunger): SK4 / Becu, Au on Ni Plated; PD, No PlatedSpring (Spring): SWP /SUS, Au on Ni Plated
Electrical Specifications:
Frontal Static Current (Current Rating): 3 Amps
Bandwidth: -1 dB @ 14.8 GHz
Inductace (Inductace): 1.25 nH
Capacitance (Captance):1.63 pF
ProductIntroduction
Semiconductor test probes are also known as dual head probes” Commonly used intemal needle typesincude B,JJ1,,U1,etc, with small volume and hightest accuracy requirements. Structurally divided into: dual-head single-action probe series,dual-head double-action probe series.
Mainly used for extremely low contact resistance and ultra-high bandwidth in various communication power electronic components,semiconductor wafer testing, chip packaging testing,etc, meeting the requirements of 5-40G high-frequency signal testing.
Currently, Xindeli can process small probe diameters: head p: 0.06mm/needle tube p:0.10mm.
