ICT-FCT test probes (commonly known as spring pins, contact pins, or pogo pins) are the core precision contact components used in the electronics manufacturing industries for ICT (In-Circuit Testing) and FCT (Functional Circuit Testing). Their primary function is to establish a stable, low-resistance electrical connection between the test equipment and the test points on the PCB or PCBA (land, vias, and component leads), enabling signal transmission and data acquisition. They are essential consumables for ensuring accurate and efficient testing.
In the consumer electronics sector, it is primarily used for high-volume testing of motherboards and modules in products such as mobile phones, computers, smart wearables, and home appliances, and is well-suited for high-density, miniaturized testing scenarios. In the automotive electronics industry, it meets the high-current, high-reliability testing requirements for ECUs, BMS (Battery Management Systems), and in-vehicle controllers.
Post time: May-14-2026

