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SWP165
SWP165 Series
ProductParameters
Materials & Plated:
Needle 1 (Plunger): BeCu, Au on Ni PlatedNeedle Tube (Barrel): Brass, Au on Ni PlatedNeedle 2 (Plunger): BeCu, Au on Ni Plated
Part: PTFE
Spring (Spring): SWP, Au on Ni Plated
Electrical Specifications (Electrical Spec):
Frontal Static Current (Current Rating): 17A (30s)/10A (300s)
Contact Resistance: 160 mil ohms
Technical Specifications:
Full Stroke: 5.0 mm
Rated Stroke: 3.3 mm
Rated Spring Force (Spring Force): 100 gf @ load 3.3 mm
Normality Condition: Pin 1,2 Open
Press Down: Pin Rod 1,2 Conductive (Press Down 1.5mm)
Product
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SCPA016
Ni Plated
Needle 1 (Plunger): SK4 / Becu, Auon Ni Plated; PD, No PlatedNeedle 2 (Plunger): SK4 / Becu, Auon Ni Plated; PD, No PlatedSpring (Spring): SWP / SUS, Au on Ni Plated
Electrical Specifications:
Frontal Static Current (Current Rating): 4 Amps
Bandwidth: -1 dB @ 7.5 GHz
Inductace (Inductace): 1.45 nH
Capacitance (Captance):1.95 pF
ProductIntroduction
olume and nighest acura requremens. structural ided inte: dua head – singe -acion probe, dual head – double- action probe seles.
Mainly used for extremely low contact resistance and ultra-high bandwidth in various communikcation power electronic components, semiconductorwafer testing, chip packaging testing, etc, meeting the requirements for high-frequency signal testing at 5-40G.
Currently, Xindeli can process small probe diameter: head: 0.06mm /needle tube p: 0.10mm.


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SCFB038
SCFB038 Series
ProductParameters
Materials & Plated:
Needle Tube (Barrel): Ph, Au on Ni Plated
Needle 1 (Plunger): SK4/Becu, Auon Ni Plated; PD, No PlatedNeedle 2 (Plunger): SK4/Becu, Au on Ni Plated; PD,No PlatedSpring (Spring): SWP /SUS, Au on Ni Plated
Electrical Specifications:
Frontal Static Current (Current Rating): 3 Amps
Bandwidth: -1 dB @ 13.1 GHzInductace (Inductace):1.20 nHCapacitance:1.55 pF
ProductIntroductior
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Mainly used for extremely low contact resistance and utra -high bandwidth in various communication power electronic components,semiconductor wafertesting, chip packaging testing, etc, meeting requirements for 5-40G high-frequency signal testing.
Currently, Xindeli can process small probe diameter: head p: 0.06 mm / needle tube q: 0.10 mm.
