SCPA035 Series
ProductParameters
Materials & Plated:
Needle Tube (Barrel): Ph/SP, Au on Ni Plated
Needle 1 (Plunger): SK4 / Becu, Auon Ni Plated; PD, No PlatedNeedle 2 (Plunger): SK4/ Becu, Au on Ni Plated; PD, No PlatedSpring (Spring): SWP /SUS, Au on Ni Plated
Electrical Specifications:
Frontal Static Current (Current Rating): 3 Amps
Bandwidth: -1 dB @ 14.8 GHz
Inductace (Inductace): 1.25 nH
Capacitance (Captance):1.63 pF
ProductntroductionSemiconductor test probes are also known as dualhead probes.Commonly used intemal needle types indude B,JJ,U, U1,et, with smallvolume and hightest accuracy requirements.Structurally divided into: dual-head – single-action probe series,dual-head double-action probe series.
Mainly used for extremely low contact resistance and utra-high bandwidth in various communication power electronic components,semiconductor wafer testing, chip packaging testing, etc, meeting the requirements of 5-40G high-frequency signal testing.
Currently, Xindeli can process small probe diameter: head: 0.06mm /needle tube q: 0.10mm.