Products
SCFB038
Productntroduction Semikconductor test probes are atso known as “dua head probes Commonly used Internal needl tpes ncud B,J1, U, U1,etc, wth smallske and hightesting accuracy requirements.Structurally divided into: dua-head – single-action probe series, dual-head -double-action probe series.
Mainly used for extremely low contact resistance and ultra-high bandwidth in various communication power electronic components.
semiconductor wafer testing, chip packaging testing,etc, meeting the requirements of 5-40GHz high-frequency signal testing.
Currently, Xindeli can process small probe diameters: head 0.06mm/needle tube p 0.1omm.
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